GALCIT Colloquium
Guggenheim 133 (Lees-Kubota Lecture Hall)
Reliability Assessment of Microelectronic Packaging and MEMS
Soon-Bok Lee,
professor of mechanical engineering,
Korea Advanced Institute of Science and Technology (KAIST),
"Reliability Assessment of Microelectronic Packaging and MEMS," Soon-Bok Lee, professor of mechanical engineering, Korea Advanced Institute of Science and Technology (KAIST).
For more information, please contact Martha Salcedo by phone at 4450 or by email at [email protected] or visit http://today.caltech.edu/eas/listing.adp?template=galcit&sponsor_id=322&range=this_week.
Event Series
GALCIT Colloquium Series